Potential Services

As provided with state of the art research tools for micro and nano devices R&D, MENT potentially able to offer contract research or services for: i) Nano scale surface imaging and analysis using Scanning Electron Microscopy (SEM), ii) Atomic Scale perfect and nearly perfect epitaxy analysis deploying HR-XRD through rocking curve and reciprocal techniques. In the near future upon acquiring additional attachment, powder diffraction techniques also able to be offered, iii) RF on Wafer (RFOW) and module characterization of frequency up to 40 GHz, iv) Micro scale defect imaging using Metrology Microscope, v) Bragg mirror analysis using UV-VIS spectrometer, vi) Nano scale elemental analysis using EDAX, vii) Electrical characterization and analysis using CV/IV, Four Point Probes, Micro Probe (TM R&D Patent Pending) and hall effect, viii) Materials thermal conductivity and impedance analyzer to be available in Julai 2006. In near future MENT is anticipated able to provide nano technology characterization capability by deploying Surface Probe Microscopy (SPM) and Focus Ion Beam (FIB) facility.